- Details
- Hits: 6918
Fedorenko L., Matyash I.E., Kazantseva Z.I., Rudenko S.I., Kolomiychenko Y.V. // Source:Applied Surface Science. – 2014. – V. 290 . - P.1 – 5
- Details
- Hits: 6151
Sterligov V.A., Grytsaienko I.O., Men Y., Nesterov M.L., Nikitin A.Yu. // Plasmonics. – 2014. - V.9 ( Issue 2 ) - P. 219-226
- Details
- Hits: 5927
- Details
- Hits: 5973
- Details
- Hits: 6026
- Details
- Hits: 21136
- Details
- Hits: 20509
- Details
- Hits: 21228
- Details
- Hits: 21625
- Details
- Hits: 6971
- Details
- Hits: 6511
- Details
- Hits: 5712
- Details
- Hits: 4938
- Details
- Hits: 5105
- Details
- Hits: 5347
- Details
- Hits: 5653
- Details
- Hits: 5074
- Details
- Hits: 5845
- Details
- Hits: 5746
- Details
- Hits: 5242
- Details
- Hits: 5170
More Articles...
- Measuring the depth profiles of strain/composition in AlGaN-graded layer by high-resolution x-ray diffraction
- Механизм протекания тока в омическом контакте Au-Ti-Al-Ti-n+-GaN в диапазоне температур 4.2 – 300К
- X-ray diffraction investigation of GaN layers on Si (1 1 1) and Al2O3 (0 0 0 1) substrates
- Optical properties of irradiated epitaxial GaN films