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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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Our design Publications dep02 dep-02-before X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiationV.B. Molodkin, S.I. Olikhovskii, E.G. Len, B.V. Sheludchenko, S.V. Lizunova, Ye.M. Kyslovs’kyy, T.P. Vladimirova, E.V. Kochelab, O.V. Reshetnyk, V.V. Dovganyuk, І.М. Fodchuk, T.V. Lytvynchuk, V.P. Kladko and Z. Świątek // Physica Status Solidi (А), V.208, Issue 11. P.2552-2557 (2011).
