Effect of ultrasound on reverse leakage current of silicon Schottky barrier structure

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

You are here: Home

Olikh O., Voitenko K., Burbelo R., Olikh Ja // Journal of Semiconductors - 2016 - V.37 - N12 - Р.122002-1 – 122002-7

Nav view search