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O.I. Liubchenko, V.P. Kladko, Metallofizika i Noveishie Tekhnologii, V.40, Issue 6, P.759–776 (2018). https://doi.org/10.15407/mfint.40.06.0759
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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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Research divisions Publications dep02 dep-02-2018 Simulation of X - Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical L ayers Thickness
Research divisions Publications dep02 dep-02-2018 Simulation of X - Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical L ayers Thickness