Some properties of thin film structures on the base of ZnO obtained by MOCVD method

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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N.M. Roshchina, P.S. Smertenko, V.G. Stepanov, L.V. Zavyalova and O.S. Lytvyn // Solid State Phenomena, V.200, P. 3-9 (2013)

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