Atomic force microscopy and Raman spectroscopy of Pb1−xSnxTe surfaces polished after treatment with H2O2–HBr

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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Atomic force microscopy and Raman spectroscopy of Pb1−xSnxTe surfaces polished after treatment with H2O2–HBr–ethylene glycol etchants

G.P. Malanych, O.F. Kolomys, A.A. Korchovyi, N.V. Safriuk, V.M. Tomashyk // Applied Nanoscience, V.9, P.1-9 (2019). https://doi.org/10.1007/s13204-019-00974-x

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