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A.V. Kuchuk, M. Guziewicz, R. Ratajczak, M. Wzorek, V.P. Kladko, A. Piotrowska. // Materials Science Forum, V.645-648 (Silicon Carbide and Related Materials 2009). P.737-740 (2010).
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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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Research divisions Publications dep02 dep-02-before Reliability Tests of Au-metallized Ni-based Ohmic Contacts to 4H-n-SiC with and without Nanocomposite Diffusion Barriers
Research divisions Publications dep02 dep-02-before Reliability Tests of Au-metallized Ni-based Ohmic Contacts to 4H-n-SiC with and without Nanocomposite Diffusion Barriers