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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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Research divisions Publications dep02 dep-02-before Combined Multiparametric X-Ray Diffraction Diagnostics of Microdefects in Silicon Crystals after Irradiation by High-Energy ElectronsE.N. Kislovskii, V.B. Molodkin, S.I. Olikhovskii, ....I.M. Fodchuk, T.V. Lytvynchuk and V.P. Kladko. // Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, V.7, No3, P.523-530 (2013). http://x-ray.net.ua/downloads/prints/papers/xray_370.pdf
