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Marek Wzorek, Andrzej Czerwiński, Jacek Ratajczak, Michał A. Borysiewicz, Andrian V. Kuchuk, Anna Piotrowska, Jerzy Kątcki // Materials Science Forum, Vol. 778 – 780, P.697-701 (2014).
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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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Research divisions Publications dep02 dep-02-before Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS.
Research divisions Publications dep02 dep-02-before Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS.