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J. Li, B. Kempken, V. Dzhagan, D. R. T. Zahn, J. Grzelak, S. Mackowski, J. Parisi and J. Kolny-Olesiak // Cryst.Eng.Comm. 17 (2015) 5634-5643. DOI: 10.1039/c5ce00380f
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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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