Measurements of alloy composition and strain in thin GexSi1-x

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

M.Ya. Valakh, V.N. Dzhagan, P.M. Lytvyn, V.A. Yukhymchuk, Z.F. Krasil'nik, A.V. Novikov, D.N. Lobanov // Phys. Solid State V. 46(1), P. 85 (2004)

Nav view search