Effect of Si nanoparticles embedded in SiOx on optical properties of the films studied by spectroscopic ellipsometry and photoluminescence spectroscopy

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

Szekeres, T. Nikolova, A. Paneva, I. Lisovskyy, P.E. Shepeliavyi, G.Yu. Rudko // Optical Materials V. 30, Is. 7, P. 1115-1120 (2008)

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