Fields of deformation anisotropy exploration in multilayered (In,Ga)As/GaAs structures by high-resolution X-ray scattering

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

O. Yefanov, V. Kladko, O. Gudymenko, V. Strelchuk, Yu. Mazur, Zh. Wang, G. Salamo // Рhys. Stat.

Sol. (a) V. 203, № 1, Р. 154-157 (2006)

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