EPR and Optical Study of SiO2 Films Implanted with Germanium Ions

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

V.Ya. Bratus’, M.Ya. Valakh, E.G. Gule, S.M. Okulov, V.O. Yukhymchuk // Ukrainian Journal of Physics V. 50, N 6, P. 610-617 (2005)

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