Study of mechanical strain in Si1-xGex layers using Raman spectroscopy

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

V. V. Artamonov, M. Ya. Valakh, V. N. Dzhagan, R. L. Politansky, V. O. Yukhimchuk // Functional Materials, V. 9, N 2, P. 232-236 (2002)

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