Visualisation of submicron Si-rods by SPR-enhanced total internal reflection microscopy

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

Rengevych O.V., Beketov G.V., Ushenin Yu.V. // Semiconductor Physics, Quantum Electronics and Optoelectronics. – 2014. - V17, №4. - Р.32-38

Nav view search