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V.F. Mitin // Advances in Cryogenic Engineering, Vol.43, pp.749-756 (1998)

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K.A. Dauletov, G.N. Kashin, R.V. Konakova, V.V. Milenin, V.F. Mitin // Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques, No.3, pp.60-62 (1999) [in Russian]

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V.F. Mitin // Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol. 2, No. 1, pp.115-123 (1999)

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N.S. Boltovets, V.V. Basanets, V.N. Ivanov, V.A. Krivutsa, A.E. Belyaev, R.V. Konakova, V.G. Lyapin, V.V. Milenin, E.A. Soloviev, E.F. Venger, D.I. Voitsikhovski, V.V. Kholevchuk, V.F. Mitin // Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol. 3, No. 3, pp. 359-370 (2000)

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A.E. Belyaev, R.V. Konakova, V.V. Milenin, E.A. Soloviev, D.I. Voitsikhovskyi, N.S. Boltovets, V.V. Basanets, V.A. Krivutsa, V.F. Mitin // Romanian Journal of Information Science and Technology, Vol. 3, No. 1, pp. 5-15 (2000)

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V.F. Mitin, N.S. Boltovets, V.V. Kholevchuk, R.V. Konakova // Inzhenerno-Fizicheskii Zhurnal [Journal of Engineering Physics and Thermophysics] Vol. 73, No. 1, pp. 202-205 (2000)

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V. Mitin, J. McFarland, G. Ihas, V.К. Dugaev // Physica B: Condensed Matter, Vol. 284-288, pp. 1996-1997 (2000)

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E. Atanassova, A. Paskaleva, R. Konakova, D. Spassov, V.F. Mitin // Microelectronics Journal, 32, pp. 553-562 (2001)

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V.A. Odarich, O.V. Rudenko, M.P. Semen’ko, R.V. Konakova, V.F. Mitin, V.V. Kholevchuk // Functional Materials, Vol. 8 No. 2 pp. 355-360 (2001)

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N.S. Boltovets, V.V. Kholevchuk, R.V. Konakova, V.F. Mitin and E.F. Venger // Sensors and Actuators, Vol. 92, pp. 191-196 (2001)

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V.K. Dugaev, G.G. Ihas, C. McKenney, V.V. Kholevchuk, V.F. Mitin, I.Yu. Nemish, E.A. Soloviev, M. Vieira // Proc. of IEEE Sensors 2002, Vol.2 (Piscataway, NJ, 2002), pp.1275 – 1280. First IEEE International Conference on Sensors, Orlando, USA, June 12-14, 2002.

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N.S. Boltovets, V.K. Dugaev, V.V. Kholevchuk, P.C. McDonald, V.F. Mitin, I.Yu. Nemish, F. Pavese, P.V. Sorokin, E.A. Soloviev, E.F. Venger // Temperature: Its Measurement and Control in Science and Industry, Vol.7, edited by Dean C. Ripple, AIP Conference Proceedings 684, pp.399-404 (2003)

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V.F. Mitin, V.V. Kholevchuk, R.V. Konakova, E.F. Venger, V.A. Odarich, O.V. Rudenko, M.P. Semen’ko, M.V. Khimenko // Proc. of 23th International Conference on Microelectronics (MIEL’02) Nis, Yugoslavia, Vol.1, pp.401 — 404, May 12-15 (2002)

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V.F. Mitin, V.V. Kholevchuk, V.K. Dugaev, M. Vieira // Defect and Impurity Engineered Semiconductors and Devices III. Editors: S. Ashok, J. Chevallier, N.M. Johnson, B.L. Sopori, H. Okushi. MRS Proceedings, Vol.719 (Materials Research Society, Warrendale, 2002), pp.445–450. 2002 Materials Research Society (MRS) Spring Meeting, San Francisco, USA, April 1 – 5, 2002.

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V.K. Dugaev, V.F. Mitin // Proc. of 2nd International Seminar on Low Temperature Thermometry, Wroclaw, Poland, October 6–7, 2003. Edited by A. Szmyrka-Grzebyk and A. Kowal (INTiBS, Wroclaw, 2003), pp.151 — 157.

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V.F. Mitin, N.S. Boltovets, V.V. Kholevchuk, I.Yu. Nemish // Proc. of 2nd International Seminar on Low Temperature Thermometry, Wroclaw, Poland, October 6–7 (2003)

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G.G. Ihas, V.F. Mitin, N.S. Sullivan // Journal of Low Temperature Physics, Vol. 134 (1-2) pp. 437-442 (2004)

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V.F. Mitin, N.S. Boltovets, V.V. Basanets, V.V. Kholevchuk, I.Yu. Nemish, F. Pavese, P.C. McDonald // Proc. of 9th International Symposium on Temperature and Thermal Measurements in Industry and Science, “TEMPMEKO 2004”, Cavtat-Dubrovnik, Croatia, June 21-25, pp.643-648 (2004)

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V.F. Mitin, P.C. McDonald, F. Pavese, N.S. Boltovets, V.V. Kholevchuk, I.Yu. Nemish, V.V. Basanets, V.K. Dugaev, P.V. Sorokin, E.F. Venger, E.V. Mitin // Proc. of the Twentieth International Cryogenic Engineering Conference (ICEC 20): Beijing, China, 11-14 May 2004, pp.971-974. (Zhang, Liang (EDT) /Lin, Liangzhen (EDT) /Chen, Guobang (EDT) /Publisher: Elsevier Science Ltd Published 2006/03, ISBN:0080445594 (Hard cover book).

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E. Atanassova, R.V. Konakova, V.F. Mitin, J. Koprinarova, O.S. Lytvyn, O.B. Okhrimenko, V.V. Schinkarenko, D. Virovska // Microelectronics Reliability, Vol. 45, pp. 123-135 (2005)